Applied Statistics for Engineers
NIST e-Handbook-grounded applied statistics — exploratory data analysis, distributions, intervals, hypothesis testing, DOE, capability, SPC, and regression.
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Faculty
Faculty details for this seminar will be announced with the full schedule.
Fees
Early: $1,895 (payment 4+ weeks ahead)
Standard: $2,095 (check/ACH) · $2,165 (card)
Group discount: $200 off per attendee for 3+ from the same organization.
Also Available
- Corporate on-site delivery at your facility
- Private cohort sessions
- Digital curriculum licensing
Seminar Overview
Engineers are drowning in data and starving for statistics. This two-day seminar is built from the **NIST/SEMATECH e-Handbook of Statistical Methods** — the multi-section engineering statistics reference maintained by the National Institute of Standards and Technology and SEMATECH — supplemented with the reliability life-data corpus (Weibull and life-distribution methods) for the failure-data questions every quality and test engineer faces. The e-Handbook is the primary source: its exploratory data analysis chapter, probability-distribution gallery, estimation and hypothesis-testing chapters, design-of-experiments and process-modeling sections, and its control-chart and capability material are the backbone of every module.
This is not a mathematics course. It is a decision course: which plot to make first, which test to run, what the p-value does and does not license you to claim, how wide your confidence interval really is, whether your process is capable of the print, and how to design an experiment that answers a question in one round instead of four. Day one covers exploratory data analysis, distributions, estimation, and hypothesis testing; day two covers design of experiments, capability, SPC, and regression — each with worked engineering datasets drawn from manufacturing, dimensional measurement, and reliability practice.
The differentiator: every module is taught from PRIMARY SOURCE material — the NIST/SEMATECH e-Handbook's own methods, worked examples, and case data, plus reliability references for failure-time data — not vendor slide decks. You leave able to run a defensible statistical analysis on your own data and to challenge the statistics you are handed by others.
Ideal Learner
- Quality engineers, process engineers, and manufacturing engineers who own SPC, capability, and validation data
- Design, test, and validation engineers who must design experiments and interpret test results
- Supplier-quality and PPAP engineers reviewing Cpk studies, Gage R&R, and capability submissions
- Reliability and field engineers who analyze failure and warranty data statistically
- Industry segments: automotive OEM/Tier 1, medical devices, electronics, industrial equipment, injection molding and plastics processing
Learning Objectives
- Perform structured exploratory data analysis — histograms, box plots, run charts, lag plots, and normal probability plots — and state what each is diagnostic of before running any test
- Select the correct probability distribution (normal, lognormal, exponential, Weibull, binomial, Poisson) for an engineering dataset and justify the selection with a probability plot
- Construct and interpret confidence, prediction, and tolerance intervals for means, variances, and proportions — and explain the difference between the three on the shop floor
- Formulate and run the correct hypothesis test (t-test, F-test, chi-square, ANOVA), set significance and power, and size the sample before the test, not after
- Plan a full or fractional factorial designed experiment, read main effects and interactions, and state the experiment's answer in engineering units
- Compute and interpret Cp, Cpk, Pp, and Ppk against one- and two-sided specifications, including non-normal capability via Weibull analysis
- Select and build the correct control chart (X̄-R, individuals, p, np, c, u, EWMA) and distinguish common-cause from special-cause signals
- Build a least-squares regression model with honest residual analysis and defend its limits
Consulting Sessions
Seminar attendees can sign up for individual consulting sessions with the instructor. Sessions are free for registered attendees, first-come first-served — sign up when registering by calling 248-539-0473 or during the seminar.
Seminar Outline
- The NIST/SEMATECH EDA discipline: plot before you compute
- Histograms, run-sequence plots, lag plots, box plots, quantile–quantile and normal probability plots
- Outliers: investigation vs. deletion; what autocorrelation in a lag plot kills
- **Statistics Case Study: a dimensional dataset whose "outliers" were a tooling change**
- **Exercise 1: EDA a 40-point measurement dataset and write the three findings before any test**
- The distribution gallery: normal, lognormal, an affiliated engineering firmial, Weibull, binomial, Poisson — where each arises physically
- Probability plotting to select the distribution; skewness and what it implies
- Failure-time and count data: the binomial/Poisson/an affiliated engineering firmial family and its tie to reliability data
- **Exercise 2: match five datasets to five distributions using probability plots**
- Point estimates vs. intervals; standard error and what moves it
- Confidence intervals for the mean, variance, and proportion; sample-size planning
- Tolerance intervals vs. prediction intervals vs. confidence intervals — the distinction that decides capability disputes
- **Exercise 3: build a 95% confidence interval and a 95%/99% tolerance interval on the same dataset and reconcile the two**
- Null and alternative hypotheses, Type I and Type II error, significance level and power
- One- and two-sample t-tests, F-test for variances, chi-square for proportions and goodness of fit
- One-way ANOVA and post-hoc comparisons; p-values and what they do not prove
- **Statistics Case Study: a supplier "improvement" that failed a properly powered comparison**
- **Exercise 4: power and sample-size a two-material comparison before collecting data**
- Full factorial designs: main effects, interactions, replication, randomization, blocking
- Fractional factorials and screening designs; aliasing and what you trade away
- From experiment to engineering answer: effect plots, model reduction, confirmation runs
- **Exercise 5: plan a 2^(4-1) fractional factorial on a molding parameter set and identify the aliased pairs**
- Cp, Cpk, Pp, Ppk: short-term vs. long-term, within-subgroup vs. overall variation
- One-sided specifications and attribute-data capability; non-normal capability via Weibull and transformation methods
- Measurement-system contribution and why Gage R&R gates every capability study
- **Statistics Case Study: a Cpk of 1.67 that evaporated once gage error was accounted for**
- Shewhart logic: subgroups, rational sampling, common vs. special cause
- X̄-R and X̄-s charts, individuals & moving range, attribute charts (p, np, c, u), EWMA and CUSUM for small shifts
- Chart-selection decision tree; out-of-control action plans engineers actually follow
- **Exercise 6: build and interpret an X̄-R chart and an I-MR chart from the same process, and explain when each is legitimate**
- Least-squares fitting, coefficient interpretation, and residual analysis — the four residual plots that catch model failure
- Polynomial and multiple regression; multicollinearity warning signs
- Correlation vs. causation; extrapolation limits; tying the model back to DOE
- **Statistics Case Study: a predictive model that failed the moment it left its data's range**
- **Exercise 7: fit, diagnose, and bound a regression model on processing data, then state its valid operating window**
More in Track D — Reliability, Statistics & Compliance
- D-01 · Reliability Life Data Engineering — 3-day · Advanced
- D-02 · Reliability Prediction and RAM Engineering — 3-day · Intermediate
- D-03 · Accelerated Life Testing — 3-day · Advanced
- D-05 · Environmental Testing and Qualification — 3-day · Advanced
- D-06 · Warranty Engineering & Field-Failure Analysis — 2-day · Intermediate
- D-07 · Automotive Regulatory Compliance — 3-day · Advanced
- D-08 · Medical Device Regulation: EU MDR & FDA QMSR — 3-day · Advanced
- D-09 · Export Controls Compliance: ITAR & the EAR — 2-day · Advanced